Reliable Grade and Purity Control of Geological Materials by EDXRF

Frank Portala, Kai Behrens

Bruker AXS GmbH, 76187 Karlsruhe/Germany


Volume 6, Issue 1, Pages 69 - 72


Energy dispersive X-ray Fluorescence Spectrometry (EDXRF) instrumentation is the best suited analytical technology for the on-site control of mining operations and the determination of final product grade. The technique requires only a very simple and straightforward sample preparation which makes it a practical, fast and reliable method for multi-element determination in geological materials. Until recently the sensitivity was poor for light elements such as sodium and magnesium due to thick etector windows which absorbed nearly all radiation from light elements. However, recent advantages of modern Silicon Drift Detector (SDD) technology combined with high power direct excitation and thin stabilized entrance window make the instrument discussed far more suitable for such elemental analysis compared to other instruments. The article covers the recent advances in modern EDXRF instrumentation and the impact on the elemental analysis of geological materials. Data are shown to demonstrate the analytical performance, precision and long-term stability of such instrumentation for grade and purity control at mining sites and in control laboratories.


X-ray fluorescence analysis, XRF, energy dispersive X-ray fluorescence spectrometry, EDXRF, geological analysis, mining, grade control, purity control, silicon drift detector


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